CONDUCTANCE NOISE IN DISORDERED MATERIALS AND SYSTEMS OF TECHNOLOGY

M. Baziljevich (Univ. of Oslo, Norway), et al: Flicker noise and fractal structure near the percolation threshold for YBaCuO epitaxial films

V.D. Ashkenazy (Bar-Ilan Univ., Ramat Gan, Israel), et al: Random telegraph voltages in high-Tc superconducting films

L.K.J. Vandamme (Univ. of Eindhove, NL): The role of intergrain contacts in the resistance noise of high-temperature superconductors

Z. Gingl, et al (JATE Univ.,Hungary), C. Pennetta, et al (Univ. of Lecce, Italy): Noise, Biased Percolation and Abrupt Failure of Electronic Devices

L.B. Kiss, et al (JATE Univ.,Hungary): Current controlled noise exponents at percolation in high-temperature superconductor thin films

NOISE IN BIOLOGICAL SYSTEMS

G. Lanfermann (Univ. of St. Louis at Missouri), et al: Spike timing precision of an array of noisy Hodgkin-Huxley neurons

I. Opris (Univ. of Tennessee, USA): Storage Capacity of Associative Memories with Nonmonotonic Neurons

NOISE IN NONLINEAR (DYNAMICAL) SYSTEMS

J.J. Collins (Boston Univ, USA), et al: Noise-stabilised inverted pendulums: fact or fiction?

B. Malomed (Tel Aviv Univ., Israel): Collective dynamics of solitons under the action of noise

A.A. Dubkov (Lobachevskiy Univ, Russia), et al: Statistical approach to analysis of chaotic oscillations

H.S. Wio (Atom. Res. centr, Argentina): Stochastic Resonance in a Simple Reaction-Diffusion Extended System

J. Luczka (Silesian Univ., Poland): What Minimal Noise is Necessary for Generation of Transport in Periodic Structures ?

S. Kuznetsov (Saratov St. Univ., Russia): Phase transition via on-off intermittency in models with periodic dichotomous noise

C.S.M. Lainscsek, et al. (T.Univ. Graz, Austria): Global Modeling and Prediction of Three Dimensional Dynamical Systems and the Time Series of the Sunspot Number

K. Lorincz, et al (JATE, Hungary): Stochastic resonance at PM and FM

THERMAL NOISE: FUNDAMENTAL PROBLEMS AND PROBLEMS IN DEVICES

L. Reggiani (Univ. of Lecce, Italy): Quantum noise in transport resistive systems: is it detectable?

L. Gammaitoni (Univ. of Perugia, Italy): Quenching the thermal noise down to the quantum limit

T. Gonzalez (Univ. of Salamanca, Spain), et al: Diffusion coefficient to characterize local noise sources in submicron devices, is it the good magnitude?

J. Starikov (Vilnius Univ., Lithuania), et al.: Is the Device Noise -Temperature Spectrum a "Good" Physical Quantity?

L. Varani (Univ. Montpellier, France), et al: Is current noise operation more physical than voltage one?

D. Abbott (Univ. of Adelaide, Australia), et al: A new circuit theory paradox in the noise analysis of 2-stage RC ladder

L. Reggiani (Univ. of Lecce, Italy): Is the impedance field method valid to describe noise in transport quantum systems?

1/f AND SIMILAR NOISES IN TECHNOLOGICAL MATERIALS AND OTHER SOLIDS

K.Dagge (Max-Plack Inst., Stuttgart, Germany), et al: Noise in thin metal films after low-temperature electron-irradiation

A. Yakimov (Novgorod St. Univ, Russia), et al: Is 1/f noise caused by moving defects?

N.V. Dyanakova (Ioffe Inst. St. Peterburg, Russia), et al: The 1/f** 1.5 noise problem

Y.Y. Chen (Univ. of Eindhoven, NL): Temperature dependence of 1/f noise

P. Gottwald (T. Univ., Budapest, Hungary), et al: Anomalous additional low-frequency noise of surface origin generated in thin GaAs and InP layers

F. Grueneis (IAS, Munchen, Germany), et al: 1/f noise in semiconductor material interpreted as modulated GR-noise

T.G.M. Kleinpenning (Univ. of Eindhoven, NL): On 1/f noise and the frequency independent loss tangent

V. Palenskis, (Vilnius Univ., Lithuania) et al.: Flicker noise - a result of retrapping processes in defects

M. Tacano (Kyocera Cent.Res.lab, Kyoto, Japan): Unsolved problems on Hooge noise parameter

Yu.L. Khait (Technion, Israel), et al: Novel dynamic approach to the 1/f noise problem in solids via short-lived large atomic energy fluctuations in nanometer regions

M. Mihaila (ICCE, Bucharest, Romania): Enhanced 1/f noise induced by surface atomic motion in discontinous platinum films

E.B. Kislitsyn (Univ. of telecomm, St. Peterburg, Russia), et al: On the nature of 1/f noise in semiconductors at high electric fields

CONDUCTANCE NOISE IN ELECTRONIC DEVICES

S. Jarrix (Univ. of Montpellier, France, et al: Are noise sources associated to base and collector currents in AlGaAs/GaAs heterojunction bipolar transistors correlated?

M.J. Deen (Simon Frazer Univ., Vancouver, Canada): Issues in modelling the high frequency noise parameters of polysilicon emitter bipolar transistors

N. Lukyanchikova (Inst.Semicond.Phys., Ukraine), et al: Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions

MAGNETIC AND CONDUCTANCE NOISE IN MAGNETIC MATERIALS OF TECHNOLOGY

G. Durin (IENG Ferraris, Torino, Italy), et al: Problems in the comprehension of the Barkhausen noise

J. Briaire (Univ. of Eindhove, NL), et al : Noise and the magnetic domain structure in Ni8-Fe20 Thin Films

1/f NOISE DYNAMICS

Z. Gingl, et al (JATE Univ.,Hungary): The 1/f Spectrum of Gaussian Noise is Invariant Against Amplitude-Saturation Nonlinearity!

I. Pocsik (Res.Inst. for Sol.Stat.Phys. Budapest, Hungary), et al: Probability-topological analysis of noise generating sources

MEASUREMENT METHODOLOGY

D. Abbott (Univ. of Adelaide, Australia), et al: Is the thermal noise coefficient really 4?

G.N. Bochkov (Lobachevksy Univ, Russia), et al: The physical limits of precision of spectral and bispectral measurements

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